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Displaying 751 - 775 of 1598

Enabling photoemission electron microscopy in liquids via graphene-capped microchannel arrays

February 8, 2017
Author(s)
Hongxuan Guo, Evgheni Strelcov, Alexander Yulaev, Jian Wang, Narayana Appathurai, Stephen Urquhart, John Vinson, Subin Sahu, Michael P. Zwolak, Andrei Kolmakov
Photoelectron emission microscopy (PEEM) is a powerful tool to spectroscopically access dynamic surface processes at the nanoscale but is traditionally limited to ultra-high or moderate vacuum conditions. Here, we develop a novel graphene-capped

Static and Time-Resolved Terahertz Measurements of Photoconductivity in Solution-Deposited Ruthenium Oxide Nanofilms

January 25, 2017
Author(s)
Brian Alberding, Paul A. Desario, Adam D. Dunkelberger, Debra R. Rolison, Jeffrey C. Owrutsky, Edwin J. Heilweil
Thin film Ruthenium Oxide (RuO2) is a promising alternative material as a conductive electrode in electronic applications because its rutile crystalline form is metallic and highly conductive. Herein, a previously established solution-deposition multi

Spectral dependence of carrier lifetimes in silicon for photovoltaic applications

December 21, 2016
Author(s)
John F. Roller, Yu-Tai Li, Mario Dagenais, Behrang H. Hamadani
Charge carrier lifetimes in photovoltaic-grade silicon wafers were measured by a spectral-dependent, quasi-steady-state photoconductance technique. Narrow bandwidth LEDs were used to excite excess charge carriers within the material, and the effective

Decoupling of a Neutron Interferometer from Temperature Gradients

December 16, 2016
Author(s)
Michael G. Huber, Muhammad D. Arif, P. Saggu, T. Mineeva, David Cory, Robert Haun, Ben Heacock, K Li, J. Nsofini, D. Sarenac, Chandra Shahi, V Skavysh, Mike Snow, S. Werner, A.R. Young, Dmitry Pushin
Neutron interferometry enables precision measurements that are typically operated within elaborate, multi-layered facilities which provide substantial shielding from environmental noise. These facilities are necessary to maintain the coherence requirements

A Planar Hyperblack Absolute Radiometer

November 14, 2016
Author(s)
John H. Lehman, Michelle S. Stephens, Malcolm G. White, Andreas Steiger, Christian Monte, Joerg Hollandt, Ivan Ryger, Mathias Kehrt, Marla L. Dowell
The absolute responsivity of a planar radiometer fabricated from micromachined silicon and having carbon nanotubes as the absorber and thermistor was measured in the visible and far infrared (free-field terahertz) wavelength range by means of detector
Displaying 751 - 775 of 1598
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