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Displaying 60851 - 60875 of 74498

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Direct Observation of Macroscopic Charge Quantization

December 1, 1991
Author(s)
P Lafarge, H Pothier, Edwin R. Williams, D Esteve, C Urbina, Michel H. Devoret
The circuit formed by a nanoscale tunnel junction in series with a capacitance and a voltage source is the building block of most multi-junction circuits of single electronics. The state of this single electron box is entirely determined by the number n of

Sensitivity limits to ferrimagnetic Faraday effect magnetic field sensors

November 15, 1991
Author(s)
M. N. Deeter, Allen Rose, Gordon W. Day, S. Samuelson
In general, the sensitivity of ferrimagnetic Faraday effect magnetic field sensors is a function of both the crystal geometry and composition. The geometrical dependence of the sensitivity in nonellipsoidal crystals, such as cylinders, is complicated by
Displaying 60851 - 60875 of 74498
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