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Displaying 58926 - 58950 of 74625

Threshold K-LL Auger Spectra of P in InP

January 1, 1994
Author(s)
H Wang, J C. Woicik, T berg, M H. Chen, A Herrera-gomez, T Kendelewicz, A M {?}ntykentt {?}, K E. Miyano, S H. Southworth, B Crasemann

Traceable Standards for Scanning Electron Microscopy

January 1, 1994
Author(s)
Michael T. Postek
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and

Uncertainties in Dimensional Measurements Made at Nonstandard Temperatures

January 1, 1994
Author(s)
Dennis A. Swyt
This report examines the effects of uncertainties in temperature and coefficient of thermal expansion on the expanded uncertainty of length dimensional measurements made away from the international standard reference temperature of 20degrees C for artifact
Displaying 58926 - 58950 of 74625
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