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Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials

Published

Author(s)

S. W. Novak, J. M. Zavada, K. J. Malone
Proceedings Title
Proc., 28th Annual Microbeam Analysis Society Mtg.,
Conference Dates
July 31-August 5, 1994
Conference Location
New Orleans, LA

Citation

Novak, S. , Zavada, J. and Malone, K. (1994), Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials, Proc., 28th Annual Microbeam Analysis Society Mtg., , New Orleans, LA (Accessed June 19, 2024)

Issues

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Created December 31, 1993, Updated October 12, 2021