Novak, S.
, Zavada, J.
and Malone, K.
(1994),
Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials, Proc., 28th Annual Microbeam Analysis Society Mtg., , New Orleans, LA
(Accessed March 22, 2025)
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Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials
Published
Author(s)
S. W. Novak, J. M. Zavada, K. J. Malone
Proceedings Title
Proc., 28th Annual Microbeam Analysis Society Mtg.,
Conference Dates
July 31-August 5, 1994
Conference Location
New Orleans, LA
Pub Type
Conferences
Citation
Issues
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Created December 31, 1993, Updated October 12, 2021