@conference{765271,
  author = {S. Novak and J. Zavada and K. Malone},
  title = {Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials},
  year = {1994},
  month = {1994-01-01 00:01:00},
  publisher = {Proc., 28th Annual Microbeam Analysis Society Mtg.,  , New Orleans, LA},
  language = {en},
}