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Displaying 58526 - 58550 of 74222

Traceable Standards for Scanning Electron Microscopy

January 1, 1994
Author(s)
Michael T. Postek
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and

Uncertainties in Dimensional Measurements Made at Nonstandard Temperatures

January 1, 1994
Author(s)
Dennis A. Swyt
This report examines the effects of uncertainties in temperature and coefficient of thermal expansion on the expanded uncertainty of length dimensional measurements made away from the international standard reference temperature of 20degrees C for artifact

Variations in Size Measurements by Indicating Gaging Systems

January 1, 1994
Author(s)
Ralph C. Veale, A Strang, S Merrit, H Chou
The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing four
Displaying 58526 - 58550 of 74222
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