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Displaying 58101 - 58125 of 74383

The Effects of Quantization on 3D Topography Characterization

February 1, 1994
Author(s)
E Mainsah, P Sullivan, K Stout
This paper investigates the influence of quantization on 3D surface characterization by carrying out an analysis of surface parameter changes on a range of real and simulated surfaces. The changes in parameters are calculated as a percentage of the

A Bibliography on Apparel Sizing and Related Issues

January 1, 1994
Author(s)
Yung-Tsun T. Lee
Anthropometric data and sizing systems is an important component of apparel quality. Apparel can not be top quality unless it fits the potential wearers satisfactorily. Much research has been conducted on this topic area. Some of these research results are

A Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and development, and manufacturing facilities. At present there are no sub-micrometer pitch or sub-ten
Displaying 58101 - 58125 of 74383
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