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Displaying 56001 - 56025 of 74171

Optical Overlay Metrology at NIST

January 1, 1996
Author(s)
Richard M. Silver, Amy Singer, L Carroll, S Berg-cross, James E. Potzick
Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting these measurements is a prerequisite to improving accuracy and also for the design of standard

Optimizing the GMR of Symmetric and Bottom Spin Valves

January 1, 1996
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael, C Lin, J Sivertsen, J Judy, K Takano, A Berkowitz, T Anthony, J Brug
We have attempted to optimize the values of the giant magnetoresistance in symmetric spin valves of the type NiO/Co/Cu/Co/Cu/Co/NiO (achieving 23.4%) and in bottom spin valves of the type Co/Cu/Co/NiO (achieving 17.0%), the largest values ever reported for

Organization of MSID

January 1, 1996
Author(s)
Michelle P. Steves, Donald E. Libes
This paper presents observations and recommendations regarding the organization of MSID''s (Manufacturing systems Integration Division) publicly accessible information. The paper documents the current structure an) its formative rationales, and lays out a

Oscillatory Exchange Coupling in Fe/Cr Multilayers

January 1, 1996
Author(s)
Mark D. Stiles
First-principles calculations of the reflection probabilities for Fermi surface electrons at Cr/Fe interfaces are used to compute the strength of the oscillatory exchange coupling in Cr/Fe multilayers. These calculations show that critical spanning vectors

Overview and Vision of the NIST Engineering Design Technologies Group

January 1, 1996
Author(s)
Ram D. Sriram
The NIST Manufacturing Systems Integration Division established the Engineering Design Technologies (EDT) Group to address the critical design needs of U.S. industry. The vision of the EDT group is to be a world leader in the development of technology and
Displaying 56001 - 56025 of 74171
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