Witczak, S.
, Schrimpf, R.
, Galloway, K.
, Fleetwood, D.
, Pease, R.
, Puhl, J.
, Schmidt, D.
, Combs, W.
and Suehle, J.
(1996),
Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors, IEEE Transactions on Nuclear Science
(Accessed April 26, 2024)
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Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors
Published
Author(s)
S C. Witczak, R D. Schrimpf, K F. Galloway, D M. Fleetwood, R L. Pease, , D M. Schmidt, W R. Combs,
Citation
IEEE Transactions on Nuclear Science
Volume
43
Pub Type
Journals
Citation
Created December 31, 1995, Updated October 12, 2021