TY  - JOUR
AU  - S Witczak
AU  - R Schrimpf
AU  - K Galloway
AU  - D Fleetwood
AU  - R Pease
AU  - James Puhl
AU  - D Schmidt
AU  - W Combs
AU  - John Suehle
C2  - IEEE Transactions on Nuclear Science
DA  - 1996-01-01 00:01:00
LA  - en
M1  - 43
PB  - IEEE Transactions on Nuclear Science
PY  - 1996
TI  - Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors
ER  -