@article{798856,
  author = {S Witczak and R Schrimpf and K Galloway and D Fleetwood and R Pease and James Puhl and D Schmidt and W Combs and John Suehle},
  title = {Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors},
  year = {1996},
  number = {43},
  month = {1996-01-01 00:01:00},
  publisher = {IEEE Transactions on Nuclear Science},
  language = {en},
}