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Displaying 55526 - 55550 of 74357

HVAC CAD Layout Tools: A Case Study of University/Industry Collaboration

August 1, 1996
Author(s)
J Cagan, R Clark, P Dastidar, Simon Szykman, P Weisser
An effective partnership between industry and the university resulted in the system of design tools for the layout of HVAC systems presented in this paper and illustrated with the design of a heat pump. The system provides tools to assist in the placement

Hyperthermal (1-10 eV) cobalt deposition on Si(100)

August 1, 1996
Author(s)
M P. Knowles, S R. Leone
Cobalt atoms with enhanced kinetic energy (0-10 eV) are deposited on room temperature Si(100) and compared to thermal cobalt deposition. Growth is monitored with Auger electron spectroscopy (AES) and low energy electron diffraction (LEED). At low coverages

Improved measurements of the hyperfine structure of 87 Rb5P 3/2 state

August 1, 1996
Author(s)
J Ye, S Swartz, P Jungner, John L. Hall
We have constructed two highly stable and reproducible Rb D 2 saturated absoption spectrometers at 780 nm, using rf frequency sideband technique and third harmonic dither lockin detection method respectively. We have achieved +or-}3 kHz reproducibility on

NAMT Fremework for Discrete Parts Manufacturing: Industrial Review Roundtable

August 1, 1996
Author(s)
Neil Christopher, Selden Stewart
As a result of the review, we have focused and clarified the objectives of the Framework project as follows:analysis of specifications for relationships to existing standards and specifications and for internal consistency, testing and validation of

Real-Time Single-workstation Obstacle Avoidance Using Only Wide-Field Flow Divergence

August 1, 1996
Author(s)
Theodore(Ted) Camus, David Coombs, Martin Herman, Tsai Hong Hong
A real-time robot vision system is described which uses only the divergence of the optical flow field for both steering control and collision detection. The robot has wandered about the lab at 20 cm/s for as long as 26 minutes without collision. The entire

Stitching of Equatorial Profiles for Extended Spatial Range Assessment

August 1, 1996
Author(s)
P Sullivan, R E. Parks, Lianzhen Shao
This paper describes a method for stitching multiple overlapping interferometric measurements of the equator of a high quality sphere to produce a single profile representing the roundness of the ball. The resulting optical profile measurement is compared

Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

July 31, 1996
Author(s)
George W. Mulholland, K D. Childs, D Narum, L A. LaVanier, P M. Lindley, B W. Schueler, A C. Diebold
Particulate contamination can result in a significant yield loss during semiconductor device fabrication. As device design rule dimensions decrease the critical defect size also decreases, resulting in the need to analyze smaller defects. Current
Displaying 55526 - 55550 of 74357
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