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Displaying 55276 - 55300 of 74164

Computations of Enhanced Soot Production in Time-Varying CH4/Air Diffusion Flames

September 1, 1996
Author(s)
C. R. Kaplan, C. R. Shaddix, K C. Smyth
Recent experimental measurements of soot volume fraction in a flickering CH4/air diffusion flame show that for conditions in which the tip of the flame is clipped, soot productions is ~ 5 times greater than that measured for a steady flame burning with the

Design Modeling With Shape Algebras and Formal Logic

September 1, 1996
Author(s)
Scott Chase
A new method of describing designs by combining the paradigms of shape algebras and predicate logic representations is presented. Representing shapes and spatial relations in logic provides a natural, intuitive method of developing complete computer

Electron Interactions With C 3 F 8

September 1, 1996
Author(s)
Loucas G. Christophorou, James K. Olthoff, MVVS. Rao
To aid the many and diverse applications for which perfluoropropane (C 3F 8) is suited, we critically evaluate and synthesize existing knowledge on electron scattering and electron energy-loss processes for the C 3F 8 molecule, and provide recommendations

Intracycle Evaporative Cooling in a Vapor Compression Cycle (NISTIR 5873)

September 1, 1996
Author(s)
B. S. Kim, Piotr A. Domanski
The temperature glide of zeotropic mixtures during phase change provides the opportunity to limit throttling losses of the refrigeration cycle by intracycle evaporative cooling of the refrigerant leaving the condenser. Intracycle evaporative cooling is

Magneto-Optical Indicator Film Study of the Magnetization of a Symmetric Spin Valve

September 1, 1996
Author(s)
Valerian I. Nikitenko, V S. Gornakov, L M. Dedukh, Yury P. Kabanov, A F. Khapikov, Lawrence H. Bennett, P J. Chen, Robert D. McMichael, Michael J. Donahue, L Swartzendruber, Alexander J. Shapiro, H J. Brown, William F. Egelhoff Jr.
A magneto-optical indicator film (MOIF) technique is used for direct experimental study of the magnetization reversal process in a symmetric NiO/Co/Cu/NIFe/Cu/Co/NiO spin valve. It is shown for the first time that the reversal of the free center layer

New Certified Length Scale for Microfabrication Metrology

September 1, 1996
Author(s)
James E. Potzick
The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 micrometers to 10 mm, intended for the calibration of microscope magnification and of dimensional metrology instrument scales. Called SRM
Displaying 55276 - 55300 of 74164
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