Rice, P.
, Russek, S.
, Hoinville, J.
and Kelley, M.
(1997),
The NIST Magnetic Imaging Reference Sample, Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620490
(Accessed October 4, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
The NIST Magnetic Imaging Reference Sample
Published
Author(s)
, , J Hoinville,
Abstract
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurement have shown the variability in images taken with differnt tips and different instrument configuration which underscores the need for a well calibrated sample.Proceedings Title
Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy
Conference Dates
May 8, 1997
Conference Location
Gaithersburg, MD, US
Conference Title
Fourth Workshop on Industrial Applications of Scanned Probe Microscopy
Pub Type
Conferences
Download Paper
Keywords
MICROSCOPY
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1996, Updated October 12, 2021