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Displaying 55301 - 55325 of 74164

Ultrasonic Power Output Measurement by Pulsed Radiation Pressure

September 1, 1996
Author(s)
Steven E. Fick, Franklin R. Breckenridge
Direct measurements of time-averaged spatially integrated output power radiated into reflectionless water loads can be made with high accuracy using techniques which exploit the radiation pressure exerted by sound on all objects in its path. With an

What are Feature Interactions?

September 1, 1996
Author(s)
William Regli, Mike Pratt
Manufacturing features and their interactions have become areas of research scrutiny in recent years. It is widely accepted that intelligent reasoning about interactions among features is a critical element in the development of systems for automated

Selection of Calibration Particles for Scanning Surface Inspection Systems

August 8, 1996
Author(s)
George W. Mulholland, Nelson P. Bryner, Walter S. Liggett Jr, B W. Scheer, R. K. Goodall
In response to the semiconductor industry's need for both smaller calibration particles and more accurately sized larger particles, a joint SEMATECH, National Institute of Standards and Technology, and VLSI Standards, Inc. project was initiated to

Application of Chaotic Dynamics to Stochastic Resonance.

August 7, 1996
Author(s)
Marek Franaszek, Emil Simiu
For a class of systems with a periodic signal and noise, the improvement of the signal to noise ratio (SNR) achieved by increasing the noise intensity is referred to as stochastic resonance (SR). We show that, for a class of multistable systems, a chotic

A Neural Network Based Scheduling System for Flexible Manufacturing Cells

August 1, 1996
Author(s)
Albert T. Jones, Ying Sun, Yuehwern Yih, Luis C. Rabelo
To meet dynamic market demands and manage uncertainty during production, a flexible scheduling system is essential. In this paper we present a neural network-based scheduling system that is able to adapt different scheduling strategies dynamically, based

An Object-oriented Representation of Product and Design

August 1, 1996
Author(s)
Gerard Kim, S Gorti, A Gupta, A Wong, Ram D. Sriram
We introduct a representation scheme for engineering design synthesis that includes not only a way to represent an evolving attifact but also the design process. The representation uses an object-oriented approach in order to model a wide range of design

Application Protocol 227 Validation Report Version 1.0.

August 1, 1996
Author(s)
S W. Kline, Mark E. Palmer
Part 227 of ISO 10303, "Plant Spatial Configuration," specifies an application protocol (AP) for the exchange of spatial configuration information of process plants. This includes shape characteristics, spatial arrangement characteristics, and design and

Beyond Product Design Data: Data Standards for Manufacturing Resources

August 1, 1996
Author(s)
Kevin K. Jurrens, Mary B. Algeo, James E. Fowler
The benefits of industrial standards are well-known. They facilitate common markets, influence marketing patterns, and augment the operations of distributed enterprises. Standards for representing, using and exchanging manufacturing data, like standards
Displaying 55301 - 55325 of 74164
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