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Displaying 551 - 575 of 583

A Pulse Measurement Intercomparison

October 1, 1998
Author(s)
T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the state of the art for time-domain pulse-waveform measurements in the nanosecond regime, and to find

Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis

October 1, 1998
Author(s)
Gerard N. Stenbakken, J. P. Deyst
A new method is presented to determine the time-base errors of sampling instruments. The method does not require a model for the time-base error and, thus, provides accurate estimates where model-based methods fail. Measurements of sinewaves at multiple

Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis

June 1, 1998
Author(s)
Gerard N. Stenbakken, J. P. Deyst
A new method is presented to determine the time-base errors of sampling instruments. The method does not require a model for the time-base error and, thus, provides accurate estimates where model-based methods fail. Measurements of sinewaves at multiple

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Pulse Measurement Intercomparison

May 1, 1998
Author(s)
T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the state of the art for time-domain pulse-waveform measurements in the nanosecond regime, and to find

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half
Displaying 551 - 575 of 583
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