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A Comprehensive Approach for Testing Analog and Mixed-Signal Devices

Published

Author(s)

T. M. Souders, Gerard N. Stenbakken
Proceedings Title
Proc. 1990 Intl. Test Conference
Conference Dates
September 10-12, 1990
Conference Location
Washington, DC

Citation

Souders, T. and Stenbakken, G. (1990), A Comprehensive Approach for Testing Analog and Mixed-Signal Devices, Proc. 1990 Intl. Test Conference, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18012 (Accessed June 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 31, 1990, Updated October 12, 2021