TY  - CONF
AU  - T. Souders
AU  - Gerard Stenbakken
C2  - Proc. 1990 Intl. Test Conference, Washington, DC
DA  - 1990-09-01 00:09:00
LA  - en
PB  - Proc. 1990 Intl. Test Conference, Washington, DC
PY  - 1990
TI  - A Comprehensive Approach for Testing Analog and Mixed-Signal Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18012
ER  -