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A Custom Integrated Circuit Comparator for High Performance Sampling Applications

Published

Author(s)

Owen B. Laug, T. M. Souders, D. R. Flach
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Conference Dates
May 12-14, 1992
Conference Location
Secaucus, NJ

Citation

Laug, O. , Souders, T. and Flach, D. (1992), A Custom Integrated Circuit Comparator for High Performance Sampling Applications, Proc. IEEE Instrumentation and Technology Conference (IMTC), Secaucus, NJ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=25983 (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 1992, Updated October 12, 2021