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Displaying 54926 - 54950 of 74165

The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints

January 1, 1997
Author(s)
Steven D. Phillips, Bruce R. Borchardt, Daniel S. Sawyer, William T. Estler, David E. Ward, K Eberhardt, M. Levenson, Marjorie A. McClain, B Melvin, Ted Hopp, Y Shen
The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of known

The dynamics of chip formation in machining

January 1, 1997
Author(s)
Matthew A. Davies, Christopher J. Evans, Timothy J. Burns
In this paper, we provide experimental, numerical and analytical evidence suggesting that the onset of segmented chip formation is the result of a Hopf bifurcation in the material flow. We modify the conventional one-dimensional model for orthogonal

The NIST Electronic Kilogram

January 1, 1997
Author(s)
David B. Newell, K Fujii, Andrew Gillespie, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams
Displaying 54926 - 54950 of 74165
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