Al/Ti, composition-sensitive imaging, electron energy-loss spectroscopy, energy filtering, high-resolution electron microscopy, Ni/Ti
, van, D.
, Josell, D.
and Shapiro, A.
Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 2, 2023)