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Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination

Published

Author(s)

Z L. Wang, D van Heerden, Daniel Josell, Alexander J. Shapiro
Citation
Journal of Research (NIST JRES) -
Volume
102 No. 1

Keywords

Al/Ti, composition-sensitive imaging, electron energy-loss spectroscopy, energy filtering, high-resolution electron microscopy, Ni/Ti

Citation

Wang, Z. , van, D. , Josell, D. and Shapiro, A. (1997), Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 24, 2024)

Issues

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Created January 1, 1997, Updated February 17, 2017