Wang, Z.
, van, D.
, Josell, D.
and Shapiro, A.
(1997),
Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 3, 2024)
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Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination
Published
Author(s)
, D van Heerden, ,
Citation
Journal of Research (NIST JRES) -
Volume
102 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
Al/Ti, composition-sensitive imaging, electron energy-loss spectroscopy, energy filtering, high-resolution electron microscopy, Ni/Ti
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1997, Updated February 17, 2017