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Displaying 54951 - 54975 of 74165

The NIST Magnetic Imaging Reference Sample

January 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

The Scanning Electron Microscope

January 1, 1997
Author(s)
Michael T. Postek
The scanning electron microscope (SEM) is an important research and production tool extensively used in many phases of industry throughout the world. The popularity of the instrument results from the need to inspect and obtain information about samples

Time Domain Waveforms of a Line-Focus Transducer Probing Anisotropic Solids

January 1, 1997
Author(s)
Nelson N. Hsu, Gerald V. Blessing, D Xiang
We have developed a large lensless line-focus wideband ultrasonic transducer which can be used to probe solid materials through water. With conventional ultrasonic equipment the transducer can perform time and polarization resolved surface and body wave
Displaying 54951 - 54975 of 74165
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