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Displaying 54726 - 54750 of 74165

Mobility and formation kinetics of NH 4 + (NH 3 ) n cluster ions (n=0-3) in helium and helium/ammonia mixtures

January 1, 1997

Author(s)

M Krishnamurthy, J A. de Gouw, L N. Ding, V M. Bierbaum, S R. Leone

Molecular dynamics and hydrogen bonds in water:

January 1, 1997

Author(s)

Raymond D Mountain

Molecular Dynamics Simulations of the Thermal Degradation of Nano-Confined Polypropylene

January 1, 1997

Author(s)

Marc R. Nyden, Jeffrey W. Gilman

Molecular dynamics simulations of the thermal degradation of polymer nanocomposites were performed in an attempt to explain the reduction in the flammability of these materials, as compared to the pure polymer, that has been observed in experimental

Multielectron Dissociative Ionization of Molecules by Intense Laser Radiation

January 1, 1997

Author(s)

M Brewczyk, K Rzazewski, Charles W. Clark

N 2 and Ar Broadening and Line Mixing in the P and R Branches of the n 3 Band of CH 4

January 1, 1997

Author(s)

A S. Pine

Nano-scale Modification of Silicon Surfaces via Coulomb Explosion

January 1, 1997

Author(s)

H -. Cheng, John D. Gillaspy

Nanometer-Scale Characterization of Optical Intensity Distributions in a Two-Dimensional Photonic Crystal

January 1, 1997

Author(s)

E B. Mcdaniel, Julia W. Hsu, Lori S. Goldner, R J. Tonucci, Eric L. Shirley, Garnett W. Bryant

National Semiconductor Metrology Program::project portfolio, FY 1997

January 1, 1997

Author(s)

Stephen Knight, Alice D Settle-Raskin

National Voluntary Laboratory Accreditation Program 1997 directory:

January 1, 1997

Author(s)

Vanda R White, Vanda R White

Network-Centric CAD::a research planning workshop, 3-4 December, 1996, National Institute of Standards and Technology, Gaithersburg, Maryland

January 1, 1997

Author(s)

William C Regli, Simon Szykman, Stephen J J Smith, Peter F Brown

New Developments at the NIST/DARPA EUV Optics Characterization Facility,

January 1, 1997

Author(s)

Charles S. Tarrio

New NIST-Certified Small Scale Pitch Standard

January 1, 1997

Author(s)

James E. Potzick

The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 ?m to 10 mm, intended for the calibration of microscope magnification and dimensional metrology instrument scales. While NIST has long