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Displaying 54701 - 54725 of 74635

Book Review: Van der Waals and Molecular Science

May 1, 1997
Author(s)
Johanna Levelt Sengers, S G. Brush
Among 19th-century founders of statistical-molecular physics. Several such as Maxwell, Boltzmann, and Gibbs, have been the subject of book-length biographies and historical articles analysing their work. Comparatively little has been written in English

Computation of Fresnel Integrals

May 1, 1997
Author(s)
Klaus Mielenz
This paper summarizes the theory of Fresnel diffraction by rectangular and circular apertures with a view toward numerical computations. Approximations found in the earlier literature, and now obsolete, were eliminated and replaced by algorithms suitable

Electrothermal Simulation of an IGBT PWM Inverter

May 1, 1997
Author(s)
Alan Mantooth, Allen R. Hefner Jr.
A recently developed electrothermal network simulation methodoogy is used to analyze the behavior of a full-bridge, pulse-width modulated (PWM), voltage-source inverter, which uses insulated gate bipolar transistors (IGBT's) as the switching devices. The

Feature-Based Similarity Assessment of Solid Models

May 1, 1997
Author(s)
William Regli
This paper presents our initial efforts to develop a systematic approach for assessing the similarity of solid models based on how they will be manufactured. The goal of this work is to develop methods that, given a solid model representing the design of a

Manufacturing Process and Material Selection During Conceptual Design

May 1, 1997
Author(s)
Ronald Giachetti
It is important to consider every possible alternative during the design process since design decisions will determine the feasible manufacturing processes and the final product costs. Determining feasible combinations of material and manufacturing

Multiconductor Transmission Line Characterization

May 1, 1997
Author(s)
Dylan F. Williams
This paper presents a measurement method that completely characterizes lossy printed multiconductor transmission lines. It determines not only the matrices of impedances and admittances per unit length describing the transmission line in the conductor

On Multiple Interpretations

May 1, 1997
Author(s)
Jung-Hyun Han
Literature of feature recognition, there has been a wall between feature recognition and process planning, Manufacturing knowledge which is typically used in process planning is rarely incorporated into feature recognition, and there is little
Displaying 54701 - 54725 of 74635
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