Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Examination of Domain-Reversed Layers in Z-Cut LiNbO3 Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging

Published

Author(s)

J. A. Aust, B. Steiner, Norman Sanford, G. Fogarty, B. Yang, Alexana Roshko, J. Amin, C J. Evans
Proceedings Title
Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO)
Volume
11
Issue
5
Conference Dates
May 18-23, 1997
Conference Location
Baltimore, MD

Citation

Aust, J. , Steiner, B. , Sanford, N. , Fogarty, G. , Yang, B. , Roshko, A. , Amin, J. and Evans, C. (1997), Examination of Domain-Reversed Layers in Z-Cut LiNbO<sub>3</sub> Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging, Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO), Baltimore, MD (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created April 30, 1997, Updated October 12, 2021
Was this page helpful?