Aust, J.
, Steiner, B.
, Sanford, N.
, Fogarty, G.
, Yang, B.
, Roshko, A.
, Amin, J.
and Evans, C.
(1997),
Examination of Domain-Reversed Layers in Z-Cut LiNbO<sub>3</sub> Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging, Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO), Baltimore, MD
(Accessed October 14, 2024)
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Examination of Domain-Reversed Layers in Z-Cut LiNbO3 Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging
Published
Author(s)
J. A. Aust, B. Steiner, , G. Fogarty, B. Yang, , J. Amin, C J. Evans
Proceedings Title
Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO)
Volume
11
Issue
5
Conference Dates
May 18-23, 1997
Conference Location
Baltimore, MD
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 1997, Updated October 12, 2021