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Examination of Domain-Reversed Layers in Z-Cut LiNbO3 Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging

Published

Author(s)

J. A. Aust, B. Steiner, Norman Sanford, G. Fogarty, B. Yang, Alexana Roshko, J. Amin, C J. Evans
Proceedings Title
Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO)
Volume
11
Issue
5
Conference Dates
May 18-23, 1997
Conference Location
Baltimore, MD

Citation

Aust, J. , Steiner, B. , Sanford, N. , Fogarty, G. , Yang, B. , Roshko, A. , Amin, J. and Evans, C. (1997), Examination of Domain-Reversed Layers in Z-Cut LiNbO<sub>3</sub> Using Maker Fringe Analysis, Atomic Force Microscopy, and High-Resolution X-Ray Diffraction Imaging, Tech. Dig., Conf. on Lasers and Electro-Optics (CLEO), Baltimore, MD (Accessed June 13, 2024)

Issues

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Created April 30, 1997, Updated October 12, 2021