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Displaying 54601 - 54625 of 74165

Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability

January 1, 1997
Author(s)
Jun-Feng Song, Samuel Low, David J. Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato
Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry

Facility for Calibrating Heat Flu Sensors in a Convective Environment

January 1, 1997
Author(s)
David G. Holmberg, Kenneth D. Steckler, C A. Womeldorf, William L. Grosshandler
The National Institute of Standards and Technology (NIST) presently conducts heat flux sensor calibrations using standard radiation methods. In practice, however, many heat flux sensors are used in test environments where convective heat transfer dominates

Finish and Figure Metrology for Soft X-ray Optics

January 1, 1997
Author(s)
T Mcwaid
The performance of high quality optics relies heavily on their geometrical properties of surface finish and figure. The surface finish consists of the short spatial-wavelength departures from perfect smoothness and leads to scattering of the incident light
Displaying 54601 - 54625 of 74165
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