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Displaying 54126 - 54150 of 74337

Display Reflection Characterization

October 1, 1997
Author(s)
George R. Jones Jr.
Reflected luminance from a display surface is usually characterized as being diffuse (lambertian) and specular. Is this accurate? Does the focus length and aperture of the measuring lens have an effect on the measured reflected luminance?

Electromagnetic Signal Attenuation in Construction Materials

October 1, 1997
Author(s)
William C. Stone
Laboratory studies of electromagnetic (EM) signal propagation through construction materials were carried out as part of the NIST initiative in Non-Line-of-Sight surveying technology. From these data it is possible to determine several important material

Integrated Vision and Touch Sensing for CMMs

October 1, 1997
Author(s)
Billibon H. Yoshimi, Tsai Hong Hong, Martin Herman, M Nashman, William G. Rippey
This paper describes a calibrated and an uncalibrated method for integrating a vision system with touch sensors and a Coordinate Measuring Machine (CMM). Traditionally, vision systems are used to measure machined parts and to localize manufacturing defects

Make Me a Match

October 1, 1997
Author(s)
Isabel M. Beichl, F Sullivan
This is a tutorial article on the Hopcroft-Karp algorithm for finding a maximal matching in an undirected graph.

New Infrared Beamline at the NIST SURF II Storage Ring

October 1, 1997
Author(s)
Angela R. Hight Walker, Uwe Arp, Gerald T. Fraser, Thomas B. Lucatorto, J Wen
The success of the infrared program at the National Synchrotron Light Source [NSLS] has motivated the establishment of an infrared beamline at the infrared beamline and its associated infrared microscope instrumentation and show preliminary Fourier

Quasi-TEM Model for Coplanar Waveguide on Silicon

October 1, 1997
Author(s)
Dylan F. Williams, Michael D. Janezic, A. Ralston
This paper compares a simple quasi-TEM model for coplanar waveguide fabricated on moderately doped silicon substrates to measurement. While the coplanar waveguide currents and magnetic fields are unaffected by the substrate, a simple capacitive model can

Summary of Modeling and Simulation for NIST RoboCrane? Applications

October 1, 1997
Author(s)
E Amatucci, Roger V. Bostelman, Nicholas Dagalakis, T M. Tsai
The Intelligent Systems Division (ISD) at the National Institute of Standards and Technology has been using modeling and simulation and software for conceptual design and prototyping of advanced robotic cranes. RoboCrane¿ concepts have been developed for

TEM and EELS Investigation of a-C and ta-C Coated Field Emitters

October 1, 1997
Author(s)
Alline F. Myers, Eric B. Steel, M Q. Ding, S M. Camphausen, W B. Choi, J J. Cuomo, J J. Hren
The microstructure of highly sp 2 bonded amorphous carbon (a-C) and partially tetrahedrally bonded amorphous carbon (ta-C) films deposited on needle-shaped Mo field emitters by pulsed laser ablation and cathodic arc deposition techniques was studied using
Displaying 54126 - 54150 of 74337
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