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Displaying 54001 - 54025 of 74053

A Method to Characterize Overlay Tool Misalignments and Distortions

July 1, 1997
Author(s)
Richard M. Silver, James E. Potzick, Fredric Scire, Christopher J. Evans, Michael L. McGlauflin, Edward A. Kornegay, Robert D. Larrabee
A new optical alignment artifact under development at NIST is described. This structure, referred to as a stepped microcone, is designed to assist users and manufacturers of overlay metrology tools in the reduction of tool-induced measurement errors. We

A Tcl Package for CGI and HTML Generation

July 1, 1997
Author(s)
Don E. Libes
CGI scripts enable dynamic generation of HTML pages. This paper describes a package for writing CGI scripts in Tcl. The package is also useful for the generation for static HTML and for the translation of different formats from the same document. A brief

Analysis of Variability in the Design of Wood Products Under Imprecision

July 1, 1997
Author(s)
Ronald Giachetti, R Young
The design and analysis of many products is performed with imprecisely known parameters, relationships, and environmental conditions. This is especially true for wood products which exhibit greater variability than most materials. Fuzzy set theory applied

Atomic Collisions in Ultracold Atomic Gases

July 1, 1997
Author(s)
Paul S. Julienne, Kevin Jones, Paul D. Lett, William D. Phillips, Eite Tiesinga, U Volz, Carl J. Williams
Cold collisions between trapped atoms are very important in the context of Bose-Einstein condensation. The meaning of the scattering length, and its determination through the precision measurements of photoassociation spectroscopy, are described. This is

Biological Macromolecule Crystallization Database

July 1, 1997
Author(s)
G L. Gilliland
The NIST/CARB Biological Macromolecule Crystallization Database (BMCD) includes crystal and crystallization data on all forms of biological macromolecules that have produced crystals suitable forX-ray diffraction studies. The data include information on

Conference Report: Workshop on Advanced Methods and Models for Appearance of Coatings and Coated Objects, Gaithersburg, MD, May 20, 1996

July 1, 1997
Author(s)
M E. McKnight, J Martin, Michael Galler, Fern Y. Hunt, R Lipman, Theodore V. Vorburger, A Thompson
To help NIST researchers better understand industry''s needs, four NIST laboratories held a Workshop on Advanced Methods and Models for Appearance of Coatings and Coated Objects on May 20, 1996. The four NIST laboratories are Building and Fire Research

Dimensional Metrology at the Nanometer Level: Combined SEM and PPM

July 1, 1997
Author(s)
Michael T. Postek, H Ho, L Harrison
The National Institute of Standards and Technology (NIST) is currently exploring the potentials afforded by the incorporation of a commercial proximal probe microscope (PPM) operating in the scanning tunneling or atomic force mode into a high resolution

Growth morphologies of heteroepitaxial rutile films on sapphire substrates

July 1, 1997
Author(s)
P. A. Morris-Hotsenpiller, Alexana Roshko, J. B. Lowekamp, G. S. Rohrer
The growth morphologies of (1 0 0), (1 0 1) and (0 0 1) rutile films grown on sapphire substrates by the ion-beam sputter deposition technique have been examined as a function of film/substrate orientation, film thickness, substrate surface preparation

Managing Tcl's Namespaces Collaboratively

July 1, 1997
Author(s)
Don E. Libes
The NIST Identifier Collaboration Service (NICS) is a proposed service to encourage collaboration among researchers and developers when choosing identifiers, far in advance of when it might ordinarily occur. This would support and enhance standards
Displaying 54001 - 54025 of 74053
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