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Displaying 52051 - 52075 of 74034

450 Golden Gate Project: BACnet's(TM) First Large-Scale Test

July 1, 1998
Author(s)
M A. Applebaum, Steven T. Bushby
The Phillip Burton Federal Building and U.S. Courthouse located at 450 Golden Gate Avenue in San Francisco was selected as the site for the world's first large-scale commercial demonstration of the BACnet standard. BACnet is a standard communication

A framework for control architectures

July 1, 1998
Author(s)
M. K. Senehi, Thomas R. Kramer
The development of architectures for control systems has been an active area of research for at least twenty years. This research has produced many different architectures which use different terminologies and address different issues. In order to analyse

A Guarded Transfer Standard for High Resistance Measurements

July 1, 1998
Author(s)
Dean G. Jarrett
An improved design for a guarded transfer standard in the resistance range 1 M[Ω] to 100 G[Ω] is described. Existing transfer standards and limitations are reviewed. Interchangeable guard networks are used in the improved transfer standards to ensure

A New Technique for Determining Long-Term TDDB Acceleration Parameters of Thin Gate Oxides

July 1, 1998
Author(s)
Y Chen, John S. Suehle, Chien-Chung Shen, J B. Bernstein, C. Messick, P Chaparala
A new technique, the dual voltage versus time curve (V-t) integration technique, is presented as a much faster method to obtain time-dependent dielectric breakdown (TDDB) acceleration parameters ([alpha] and [tau]) of ultra-thin gate oxides compared to

A Reference Quality Equation of State for Nitrogen

July 1, 1998
Author(s)
R Span, Eric Lemmon, R. T. Jacobsen, Wolfgang Wagner
A new formulation describing the thermodynamic properties of nitrogen has been developed. New data sets are now available which have been used to improve the representation of the 0-0-T surface of gaseous, liquid and supercritical nitrogen, including the

A System to Measure Current Transducer Performance

July 1, 1998
Author(s)
Bryan C. Waltrip, Thomas L. Nelson
A special purpose ac current transducer measurement system capable of intercomparing transducers with ac output voltage ratios from 1:1 to 50:1 has been developed to extend the range and accuracy of current transformer, current shunt, and mutual inductor

An Accurate Measurement of Planck's Constant

July 1, 1998
Author(s)
Edwin R. Williams, Richard L. Steiner, David B. Newell
Using a moving coil watt balance, electric power measured in terms of the Josephson and quantum Hall effects is compared with mechanical power measured in terms of the meter, kilogram and second, we find the Planck constant h = 6.62606891(58) x 10 -34 Js

An Object-Oriented Representation for Product and Design Processes

July 1, 1998
Author(s)
Ram D. Sriram, S Gorti, A Gupta, Gerard Kim, A Wong
We report on the development of a knowledge representation model, which is based on the SHARED object model reported in [33,34]. Our current model is implemented as a layered scheme, that incorporates both an evolving artifact and its associated design

Assessment of Color Measurement Systems Using Interference Filters

July 1, 1998
Author(s)
Paul A. Boynton, Eric Kelley
Spectroradiometers and tristimulus colorimeters are used in display measurements to measure color in one of several color space coordinate systems. How well these instruments can measure the color coordinates can be simply checked by using interference

Calibration of Dissipation Factor Standards

July 1, 1998
Author(s)
Eric D. Simmon, Gerald FitzPatrick, O. Petersons
Dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded resistor have been developed for calibration purposes. An analysis of these DF Standards, including precautions in their construction and

Capacitance and Dissipation Factor Measurements from 1 kHz to 10 MHz

July 1, 1998
Author(s)
Andrew D. Koffman, Bryan C. Waltrip, Nile M. Oldham, S. Avramov
A measurement technique developed by K. Yokoi et al. At Hewlett-Packard Japan, Ltd. Has been duplicated and evaluated at NIST to characterize four-terminal pair capacitors. The technique is based on an accurate three-terminal measurement made at 1 kHz

Characterization of Planarity of Polymer Thin Films on Rough Surfaces

July 1, 1998
Author(s)
Wen-Li Wu, William E. Wallace
Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is to
Displaying 52051 - 52075 of 74034
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