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Displaying 51551 - 51575 of 74165

MEMS-Based Test Structures for IC Technology

December 31, 1998
Author(s)
S. A. Smee, Michael Gaitan, Yogendra K. Joshi, David L. Blackburn
As Integrated Circuit (IC) device sizes shrink, intrinsic and thermo-mechanical stress in interconnects is an ever increasing reliability concern. Increasing device density leads to more interconnect layers and hence, greater probability of stress related

Reliability Characterization of Ultra-Thin Film Dielectrics

December 31, 1998
Author(s)
John S. Suehle
The reliability of gate oxides is becoming a critical concern as oxide thickness is scaled below 4 mm in advanced CMOS technologies. Traditional reliability characterization techniques must be modified for very thin gate oxides and soft breakdown. As

Issues in Software Component Testing

December 17, 1998
Author(s)
William J. Majurski
The purpose of this project is to construct a tool for testing software APIs that integrates two established software test generation techniques: context free grammars and constraint satisfaction. Context free grammars with extensions have been used to

S2M2 A Java Applet-Based SMIL Player

December 17, 1998
Author(s)
Wo L. Chang, J Yu
Synchronized Multimedia Integration Language (SMIL) of the World Wide Web Consortium (W3C) is a simple but powerful declarative language, which extends the current multimedia technology on the Web with temporal synchronization capabilities. It uses the

Optical constants of (Al 0.98 Ga 0.02 ) x O y native oxides

December 14, 1998
Author(s)
K. J. Knopp, Richard Mirin, David H. Christensen, Kristine A. Bertness, Alexana Roshko, R A. Synowicki
We report the optical constants of oxidized crystalline and low-temperature-grown (LTG) Al 0.98Ga 0.02As films, as determined by variable angle spectroscopic ellipsometry. Data were acquired at three angles of incidence over 240-1700nm and fit to a Cauchy

Parallel Implementation of a Molecular Dynamics Simulation Program

December 13, 1998
Author(s)
Alan Mink, C A. Bailly
We have taken a NIST molecular dynamics simulation program (md3), which was configured as a single sequential process running on a CRAY C90 vector supercomputer, and parallelized it to run in a distributed memory message passing environment. Since

Report on the First-Generation NIST Convective Heat Flux Calibration Facility

December 10, 1998
Author(s)
David G. Holmberg, C A. Womeldorf
The National Institute of Standards and Technology has developed a convective heat flux calbration facility to allow evaluation of heat flux sensors. This facility is a small wind tunnel that produces a two-dimensionl laminar boundary layer across a heated

Active Multimedia Documents for Mobile Services

December 7, 1998
Author(s)
O E. Kia
Multimedia content is designed for many purposes and the services that are associated with them rely heavily on technologies that address representation, processing, and transmission of that content. This paper presents a new model that refines the
Displaying 51551 - 51575 of 74165
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