Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 501 - 525 of 73766

Demonstration of Immunity to 400 *C Forming Gas Annealing in Oxide Semiconductor Transistor via PostMetallization Annealing

March 18, 2025
Author(s)
Yu-Hsin Kuo, Dylan J. Matthews, Shinichiro N. Muramoto, TaeYoung Song, Chengyang Zhang, Xianduo Zhao, Md S. Rahman, Sanghyun Kang, Andres S. Aguirre, Seung M. Lee, Daewon Ha, Sourav Dutta, Theodore Moise, Jayakanth Ravichandran, Shimeng Yu, Alexander Grutter, Suman Datta, Tania Roy, Asif I. Khan
Hydrogen-based annealing processes like forming gas annealing (FGA), widely used in back-end-ofline (BEOL) fabrication, can severely impact the threshold voltage (VTH) and subthreshold swing (SS) stability of amorphous oxide semiconductor (AOS) transistors

Development and characterization of the NISTCHO reference cell line

March 18, 2025
Author(s)
Hussain Dahodwala, Irfan Hodzic, Alexei Slesarev, Ben Cutak, Alexander Kuzin, Rahul Lal, Jiajian Liu, James Mahon, Rajagopalan Lakshmi Narasimhan, Jaya Onuska, James Ravellette, Kelsey Reger, Sadie Sakurada, Floy Stewart, Trissa Borgschulte, Colette Cote, Kelvin Lee, Zvi Kelman, William Brad O'Dell, Britta Anderson
Well characterized reference materials enable successful collaborations within the scientific community by establishing common reagents for benchmarking studies and reducing the barriers to sharing materials and information. Here, we report the development

Using Temporal Consistency for Compressed Sensing in High-Resolution mmWave Sounding

March 18, 2025
Author(s)
Rudolph Semper, Jack Chuang, Samuel Berweger, Camillo Gentile
Switched phased array systems operating at high sample rates generate large amounts of data during measurements of radio channels, but many scenarios contain only few multipath components. Compressed Sensing suggests in these cases Nyquist-rate samples are

Detection of fractional quantum Hall states by entropy-sensitive measurements

March 17, 2025
Author(s)
Nishat Sultana, Robert Rienstra, K Watanabe, T Taniguchi, Joseph Stroscio, Nikolai Zhitenev, D Feldman, Fereshte Ghahari Kermani
Measurements of the thermopower of a clean two-dimensional electron system is directly proportional to the entropy per charge carrier1 which can probe strongly interacting quantum systems ranging from black holes2 to the fractional quantum Hall effect

Magneto-optics of a charge-tunable quantum dot: Observation of a negative diamagnetic shift

March 17, 2025
Author(s)
Giora Peniakov, A Beck, Eilon Poem, Zu-En Su, Boaz Taitler, Sven Hofling, Garnett Bryant, David Gershoni
We present magneto-optical studies of a self-assembled semiconductor quantum dot in neutral and positively charged states. The diamagnetic shifts and Zeeman splitting of many well identified optical transitions are precisely measured. Remarkably, a

2025 NIST GenAI (Pilot) Evaluation Plan for Image Discriminators

March 14, 2025
Author(s)
George Awad, Hariharan Iyer, Seungmin Seo, Peter Fontana, Yooyoung Lee
In this NIST Generative AI (GenAI) program, we invite and encourage participating teams from academia, industry, and other research labs to support research in Generative AI. GenAI is an evaluation series that provides a platform for testing and evaluation

2025 NIST GenAI (Pilot) Evaluation Plan for Image Generators

March 14, 2025
Author(s)
George Awad, Hariharan Iyer, Seungmin Seo, Peter Fontana, Yooyoung Lee
In this NIST Generative AI (GenAI) program, we invite and encourage participating teams from academia, industry, and other research labs to support research in Generative AI. GenAI is an evaluation series that provides a platform for testing and evaluation

Detection limits of AI-based SEM dimensional metrology

March 14, 2025
Author(s)
Peter Bajcsy, Brycie Wiseman, Michael Paul Majurski, Andras Vladar
The speed of in-line scanning electron microscope (SEM) measurements of linewidth, contact hole, and overlay is critically important for identifying the measurement area and generating indispensable process control information. Sample charging and damage

Dual-Frequency-Bias Programmable Josephson Voltage Standard Circuit

March 14, 2025
Author(s)
Alain Rufenacht, Anna Fox, Raegan Johnson, Benjamin Scheck, Paul Dresselhaus, Samuel Benz
This article presents a 2-V programmable Josephson voltage standard (PJVS) with dual microwave frequency inputs and multiple output taps. The design provides three main features: 1) output voltages with nanovolt resolution; 2) the ability to perform a

Mission Critical Voice Roundtable Report

March 14, 2025
Author(s)
Alison Kahn, Lisa Soucy
This report summarizes discussions from the Mission Critical Voice Virtual Roundtable hosted by the Public Safety Communications Research (PSCR) Division of the National Institute of Standards and Technology (NIST) in April 2024. PSCR convened 37 first

NIST Cybersecurity Framework 2.0: Resource & Overview Guide (Japanese translation)

March 14, 2025
Author(s)
Kristina Rigopoulos, Stephen Quinn, Cherilyn Pascoe, Jeffrey Marron, Amy Mahn, Daniel Topper
The NIST Cybersecurity Framework (CSF) 2.0 can help organizations manage and reduce their cybersecurity risks as they start or improve their cybersecurity program. The CSF outlines specific outcomes that organizations can achieve to address risk. Other

A Spatially-Resolved Evaluation of Accelerated Environmental Aging on Emerging Polypropylene-based Photovoltaic Backsheets using Raman Spectroscopy

March 13, 2025
Author(s)
Ashlee Aiello, Stefan Mitterhofer, Jan Obrzut, Karissa Jensen, Patryk Wasik, Chiara Barretta, Gernot Oreski, Stephanie Watson, Li Piin Sung, Xiaohong Gu
Accelerated aging was used to assess environmental degradation in emerging co-extruded polypropylene (PP)-based backsheets under three different environmental conditions (65 °C/20 % relative humidity (RH), 75 °C/20 % RH, and 75 °C/50 % RH). Although

Certification of Standard Reference Material(R) 965c Glucose in Frozen Human Serum

March 13, 2025
Author(s)
Amanda Bayless, William Davis, Elena Wood, Abraham Kuri Cruz, Johanna Camara, Blaza Toman, Komal Dahya, Katherine Earl, Chui Tse, Uliana Danilenko, Hubert Vesper
Standard Reference Material (SRM) 965c Glucose in Frozen Human Serum is intended for use in validating methods for the determination of glucose in human serum and plasma. A unit of SRM 965c consists of three ampoules each of four materials: Level 1, Level
Displaying 501 - 525 of 73766
Was this page helpful?