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Displaying 476 - 500 of 5222

Certification of Standard Reference Material(R) 1993 / ERM(R)-FD306 Zeta Potential - Colloidal Silica (Nominal Mass Fraction 2.2 %)

November 24, 2020
Author(s)
Yannic Ramaye, Vikram Kestens, J. Charoud-Got, S. Mazoua, G. Auclair, Tae Joon Cho, Blaza Toman, Vincent A. Hackley, T. Linsinger
This report describes the production of SRM 1993/ERM-FD306, silica particles suspended in a borate buffer, certified for electrophoretic mobility and zeta potential by electrophoretic light scattering (ELS). This material was produced following ISO 17034

Calibration Procedures for Orthogonal Superposition Rheology

November 18, 2020
Author(s)
Ran Tao, Aaron M. Forster
Orthogonal superposition (OSP) rheology is an advanced rheological technique that involves superimposing a small-amplitude oscillatory shear deformation orthogonal to a primary shear flow. This technique allows the measurement of structural dynamics of

Error Quantification in Dynamic Applications of Weakly Nonlinear Transducers

November 3, 2020
Author(s)
Lautaro D. Cilenti, Akobuije Chijioke, Balakumar Balachandran
Characterization and quantification of dynamic measurements is an ongoing area of research in the metrological community as new calibration methods are being developed to address dynamic measurement applications. The development undertaken to date largely

Materials Research & Measurement Needs for Ceramics Additive Manufacturing

November 1, 2020
Author(s)
Andrew J. Allen, Igor Levin, Suzanne E. Witt
We report on a recent workshop dedicated to additive manufacturing (AM) of ceramics that was held at the National Institute of Standards and Technology (NIST) in November 2019. This two- day all-invited meeting brought together experts from industry

Report of the 104th National Conference on Weights and Measures

August 27, 2020
Author(s)
Yvonne A. Branden, Tina G. Butcher, Richard A. Harshman, Lisa Warfield, Gloria D. Lee, John W. Barton
The 104th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 - 18, 2019, at the Hyatt Regency Milwaukee Hotel, Milwaukee, Wisconsin. The theme of the meeting was "Assuring Equity in the Marketplace: NIST and NCWM

Binary pseudorandom array test standard optimized for characterization of large field-of-view optical interferometers

August 24, 2020
Author(s)
Valeriy V. Yashchuk, Sergey Babin, Stefano Cabrini, Weilun Chao, Ulf Griesmann, Ian Lacey, Stefano Marchesini, Keiko Munechika, Carlos Pina-Hernandez, Allen L. Roginsky
Recently, a technique for calibrating the modulation transfer function (MTF) of a broad variety of metrology instrumentation has been demonstrated. This technique is based on test samples structured as one-dimensional binary pseudo-random (BPR) sequences

Evaluation of NMIJ Traveling Dual Source Bridge Using NIST Adapted Wheatstone Bridge

August 24, 2020
Author(s)
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the resistance ratio by measuring the voltage ratio using a digital multimeter, 3458A. Based on the

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA
Displaying 476 - 500 of 5222
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