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Displaying 47451 - 47475 of 74160

LINDENS: A program for lineament length and density analysis

November 1, 2000
Author(s)
Antonio M. Casas, Angel Cortes, Adolfo Maestro, M. Asuncion Soriano, Andres Riaguas, Javier Bernal
Analysis of lineaments from satellite images normally includes the determination of their orientation and density. The spatial variation in the orientation and/or number of lineaments must be obtained by means of a network of cells, the lineaments included

MatML: XML for Materials Property Data

November 1, 2000
Author(s)
E F. Begley, C P. Sturrock
This paper will provide a high level overview of MatML, an extensible markup language (XML) for materials property data. MatML is being developed in order to address the problems of interpretation and interoperability that arise when these data are

Measures for Spectral Quality in Low-Voltage X-Ray Microanalysis

November 1, 2000
Author(s)
Dale E. Newbury
Characteristic x-ray production with energetic electrons depends strongly on the overvoltage, the ratio of the incident beam energy to the critical excitation energy for the atomic species of interest. Low voltage x-ray microanalysis (beam energy < 5 keV)

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

Modification of the Phase Stability of Polymer Blends by Fillers

November 1, 2000
Author(s)
Alamgir Karim, D W. Liu, Jack F. Douglas, A Nakatani, Eric J. Amis
We investigate the influence of surface modified filler particles on the phase stability of a model blend of polystyrene (PS) and polybutadiene (PB). The upper critical solution cloud point curve of PS/PB is destabilized (upward shift of critical

Morphological Stability of a Binary Alloy: Temperature-Dependent Diffusivity

November 1, 2000
Author(s)
Sam R. Coriell, Geoffrey B. McFadden, S R. Vanaerenbergh
The effect of the temperature dependence of the diffusion coefficient on the morphological stability of a binary alloy during directional solidification is treated by a linear stability analysis. The Soret effect is also included in the analysis. Specific

Opto-Mechanical and Electronic Design of a Tunnel-Trap Si-Radiometer

November 1, 2000
Author(s)
George P. Eppeldauer, D C. Lynch
A transmission-type light-trap silicon-radiometer has been developed for the Spectral irradiance and Radiance Response Calibrations with Uniform Sources (SIRCUS) Facility of NIST to hold the spectral power and irradiance responsivity scales between 406 nm

Overview of the TREC-8 Web Track

November 1, 2000
Author(s)
D Hawking, Ellen M. Voorhees, Nick Craswell, Peter Bailey
The TREC-8 Web Track defined ad hoc retrieval tasks over a 100 gigabyte collection of spidered Web documents (Large Web Task) and a selected 2 gigabyte subset of those documents (Small Web Task). Here, the guidelines and resources for both tasks are

Phase Equilibria and Dielectric Behavior in the CaO:Al 2 O 3 :Nb 2 O 5 System

November 1, 2000
Author(s)
Terrell A. Vanderah, W Febo, Julia Y. Chan, Robert S. Roth, J. M. Loezos, L D. Rotter, Richard G. Geyer, B A. Reisner, Dennis B. Minor
Subsolidus phase equilibria in the CaO:Al2O3:Nb2O5 system at 1325 C in air have been determined. One ternary phase forms, Ca2AlNbO6, which exhibits a perovskite-related structure with 1:1 or NaCl-type ordering of Al3+ and Nb5+ on the B-sites. Indexed X-ray

Plastic Strain in Thermally Cycled Flip-Clip PBGA Solder Bumps

November 1, 2000
Author(s)
Elizabeth S. Drexler
Electron-beam Moire, a technique to measure dis-placements on the sub-micrometer scale, was used to observe and calculate strain in an underfilled, flip-chip plastic ball grid array (PBGA) package. A cross section of the package, instrumented with 450-nm
Displaying 47451 - 47475 of 74160
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