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Displaying 47076 - 47100 of 74151

Standards for Reliability Testing of Heavy Vehicle Propulsion Materials

January 1, 2001
Author(s)
S Jahanmir, James F. Kelly, William E. Luecke
The objective of this project is to develop international standard test methods for assessing the reliability of ceramic components used in diesel engines and other heavy vehicle propulsion systems. Advanced ceramics such as silicon nitride offer a unique

Statistics and Measurements

January 1, 2001
Author(s)
C M. Croarkin
For more than 50 years, the Statistical Engineering Division (SED) has been instrumental in the success of a broad spectrum of metrology projects at NBS/NIST. This paper highlights fundamental contributions of NBS/NIST statisticians to statistics and to

Strategies for Standardizing EDS Measurements

January 1, 2001
Author(s)
Nicholas Ritchie
Energy dispersive X-ray spectrometers (EDS) are capable of precise and accurate electron beam measurements of composition. However, the optimal strategies for acquiring EDS standards differ from its wavelength dispersive cousin. There is a lot more

Strengths and Limitations of Surface Texture Characterization Techniques

January 1, 2001
Author(s)
Theodore V. Vorburger
Surface finish is important to the function of a wide range of industrial components including highways, ship hulls and propellers, mechanical parts, semiconductors, and optics. Hence, many documentary standards have been developed for specifying surface

Structured Polymeric Templates: Combinatorial Probes for Cellular Response

January 1, 2001
Author(s)
A Sehgal, Jack F. Douglas, Francis W. Wang, Carl G. Simon Jr., Alamgir Karim, Eric J. Amis
Novel high-throughput gradient methods have been developed to generate a range of surface structures by dewetting and phase separation on chemically patterned substrates. The research is motivated by an increasing awareness in the biomedical industry and

Summary Proceedings: Legal Metrology Seminar for the Americas

January 1, 2001
Author(s)
S E. Chappell, Charles D. Ehrlich, Kenneth S. Butcher
This paper provides a report on the Legal Metrology Seminar for the Americas that was held in conjunction with the 85th annual meeting of the National Conference on Weights and Measures (NCWM) in Richmond, VA, from July 16 through July 20, 2000. The
Displaying 47076 - 47100 of 74151
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