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NIST Authors in Bold

Displaying 47026 - 47050 of 74171

Recent Results in Trapped-Ion Quantum Computing at NIST,

January 1, 2001
Author(s)
D Kielpinski, A Ben-kish, Joseph W. Britton, V Meyer, M A. Rowe, C A. Sackett, Wayne M. Itano, C Monroe, David J. Wineland
We review recent experiments on entanglement, Bell's inequality, and decoherence-free subspaces in a quantum register of trapped 9Be+ ions.

Regenerative Stablity Analysis of Highly Interrupted Machining

January 1, 2001
Author(s)
Matthew A. Davies, Jon R. Pratt, Brian S. Dutterer, Timothy J. Burns
We discuss theoretical and experimental work that supports the use of very low radia immersion in the high-speed milling of difficult-to-machine materials, such as titanium alloys. Our theory is based upon modeling the cutting process by a kicked harmonic

Reproducible Spectral and Hyper-Spectral Analysis using NeXL

January 1, 2001
Author(s)
Nicholas Ritchie
NeXL is a collection of Julia language packages (libraries) for X-ray microanalysis data processing. NeXLCore provides basic atomic and X-ray physics data and models including support for microanalysis-related data types for materials and k-ratios

Restabilization of Electrosterically Stabilized Colloids in High Salt Media

January 1, 2001
Author(s)
V S. Stenkamp, P M. McGuiggan, J C. Berg
For electrostatically stabilized colloids, an increase in salt concentration typically causes a decrease in stability, until the electrical double layer is collapsed, in which case the instability remains as salt concentration is increased further. In

Rotational Spectrum of Sarin

January 1, 2001
Author(s)
Angela R. Hight Walker, R D. Suenram, A C. Samuels, J O. Jensen, M W. Ellzy, J M. Lochner, D Zeroka

Sapphire Statistical Characterization and Risk Reduction Program

January 1, 2001
Author(s)
Donald McClure, Robert Cayse, David R. Black, Steven Goodrich, K Lagerloef, D Peter, Daniel C. Harris, Dale McCullum, Daniel H. Platus, Charles E. Patty, Robert S. Polvani
The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different temperatures to establish a mechanical strength database for engineering design. Sapphire coupons were

Scaling Issues in the Measurement of Monolayer Films

January 1, 2001
Author(s)
Stephen M. Hsu, P M. McGuiggan, J Zhang, Y L. Wang, F Yin, Y P. Yeh, Richard S. Gates
An atomic force microscope (AFM), a surface forces apparatus (SFA), and a ball-on-inclined plane (BOIP) apparatus were used to measure the mechanical properties of thin films. The frictional force (lateral resistance) of a set of four samples with
Displaying 47026 - 47050 of 74171
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