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Displaying 46326 - 46350 of 73994

Atomic Level Surface Metrology

January 1, 2001
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Jun-Feng Song, Thomas Brian Renegar, Joseph Fu, Ndubuisi George Orji, V W. Tsai, E. C. Williams, H Edwards, D Cook, P West, R Nyffenegger
MotivationSemiconductor wafers and many types of optical elementsrequire ultra-smooth surfaces in order to functionas specifiedExamples:Laser gyro mirrors with rms roughness 0.1 nmSilicon gate oxides with thickness 3 nm,rms roughness must be significantly

Bayesian Approach to Combining Results From Multiple Methods

January 1, 2001
Author(s)
Hung-Kung Liu, Nien F. Zhang
Many solutions to the problem of estimating the consensus mean from the results of multiple methods or laboratories have been proposed. In a Bayesian analysis, the consensus mean is specified through probabilistic dependency as either a ¿parent¿ or a

Bias in the Introduction of Variation as an Orienting Factor in Evolution

January 1, 2001
Author(s)
L Y. Yampolsky, Arlin Stoltzfus
According to New Synthesis doctrine, the direction of evolution is determined by selection and not by internal causes that act by way of propensities of variation. This doctrine rests on the theoretical claim that because mutation rates are small in

Broadband Dielectric Relaxation of Polymer Composite Films

January 1, 2001
Author(s)
C. K. Chiang, R Popielarz, R Nozaki, Jan Obrzut
The broadband dielectric relaxation of a BaTiO3-polymer composite film was studied. The complex dielectric constant data from 10 -4 Hz to 10 10 Hz reveals the existence of a relaxation process at a frequency of 10 MHz in the polymer composite. On the basis

Bulk and Surface Evidence for the Long Range Spatial Modulation of X-Ray Absorption in the AlPdMn Quasicrystal at Bragg Incidence

January 1, 2001
Author(s)
G Cappello, A Dechelette, F Schmithusen, S Decossas, J Chevrier, F Comin, V Formoso, M. De Boissieu, Terrence J. Jach, R. Colella, T Lograsso, C Jenks, D W. Delaney
An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al-PD-Mn quasicrystal with the X-ray beam at normal incidence. The X-ray photoemission core levels for each element were recorded to probe the surface. The drain

Bulk-Moduli Systematics in Oxides, Including Superconductors

January 1, 2001
Author(s)
H M. Ledbetter, Sudook A. Kim
For oxides, including superconductors, we consider the systematics fo the bulk-modulus/atomic-volume (B/V α) relationship. For nonsuperconducting oxides, the B-V α diagram shows that most oxides fall in three sets: (1) rocksalt crystal structure, AO; (2)
Displaying 46326 - 46350 of 73994
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