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Displaying 45326 - 45350 of 73929

A Genetic Programming System with a Procedural Program Representation

July 1, 2001
Author(s)
John G. Hagedorn, J E. Devaney
We describe the status of a genetic programming system that is based on a procedural program representation. The procedural representation is closely related to the high level programming languages used by human programmers; it includes features such as

A Predictive Ionization Cross Section Model for Inorganic Molecules

July 1, 2001
Author(s)
John W. Hastie
To resolve a long-standing lack of experimental data for electron impact ionization cross sections for inorganic molecules, or the availability of a reliable predictive method, we have developed a modified classical model. The model relies on the know or

Accurate Pattern Registration for Integrated Circuit Tomography

July 1, 2001
Author(s)
Zachary H. Levine, S Grantham, S Neogi, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Thomas B. Lucatorto
As part of an effort to develop high resolution microtomography for engineered structures, a two-level copper integrated circuit interconnect was imaged using 1.83 keV x-rays at 14 angles employing a full-field Fresnel zone plate microscope. A major

An Introduction to the Phase-Field Method: Simulation of Alloy Solidification

July 1, 2001
Author(s)
William J. Boettinger, James A. Warren, C Beckermann, A N. Karma
An overview of the phase-field method for modeling alloy solidification is presented together with several example results. Using a phase-field variable and a corresponding governing equation to describe the state (solid or liquid) in a material as a

An MD/QM Study of the Chorismate Mutase-Catalyzed Claisen Rearrangement Reaction

July 1, 2001
Author(s)
S. E. Worthington, A. E. Roitberg, Morris Krauss
The reaction path for the rearrangement of chorismate to prephenate, catalyzed by chorismate mutase, has been calculated with ab initio quantum chemistry. The calculation of a reaction path is initiated from two catalytically competent conformations of the

Analysis of Thin Layer Structures by X-Ray Reflectometry

July 1, 2001
Author(s)
R Deslattes, R J. Mayti
The well-established structural methods of X-ray specular and diffuse scattering are less widely used in semiconductor metrology than their capababilities would suggest. We describe some technical enhancements that make these highly useful tools even more

Approximating the Number of Monomer-Dimer Coverings in Periodic Lattices

July 1, 2001
Author(s)
Isabel M. Beichl, Dianne M. O'Leary, F Sullivan
Our starting point is an algorithm of Kenyon, Randall, and Sinclair, which built upon the ideas of Jerrum and Sinclair, giving an approximation to crucial parameters of the monomer-dimer covering problem in polynomial time. We make two key improvements to

Bidirectional Reflectance Distribution Function of Rough Silicon Wafers

July 1, 2001
Author(s)
Y J. Shen, Z M. Zhang, Benjamin K. Tsai, D P. DeWitt
The trend towards miniaturization of patterning features in integrated circuits (IC) has made traditional batch furnaces inadequate for many processes. Rapid thermal processing (RTP) for silicon wafers has become more popular in recent years for IC

Calculation of Phase Equilibria in Candidate Solder Alloys

July 1, 2001
Author(s)
Ursula R. Kattner, C A. Handwerker
New solder alloys are being developed for electronic assemblies as replacements for traditional Pb-containing solder materials as a result of international pressure to remove Pb from the waste stream. In the transition period from Pb-containing to Pb-free

CDMA2000 Reverse-Link Simulation Model Design and Evaluation

July 1, 2001
Author(s)
Hamid Gharavi, R Wyatt-Millington, F Chin
This paper presents the design and implementation of a simulation model for the cdma2000 reverse link. The model includes all the radio configurations and their corresponding data rates in accordance with the IS-2000 specifications. The paper first

Combinatoral Study of Surface Pattern Formation in Thin Block Copolymer Films

July 1, 2001
Author(s)
A P. Smith, Jack F. Douglas, Alamgir Karim, J C. Meredith, Eric J. Amis
We investigate surface patterns in thin block copolymer films with a gradient in thickness, h. The usual hole and island morphologies are found when h varies from integral multiples m of the bulk lamellar thickness Lo but spinodal-like hole and island

Combinatorial Study of Surface Pattern Formation in Thin Block Copolymer Films

July 1, 2001
Author(s)
A P. Smith, Jack F. Douglas, J C. Meredith, Eric J. Amis, Alamgir Karim
Surface pattern formation in thin diblock copolymer films is investigated utilizing a high-throughput methodology to validate the combinatorial measurement approach for polymer science. Measurement libraries of block copolymer films having gradients in

Concrete Optimization Software Tool User's Guide

July 1, 2001
Author(s)
M J. Simon, Dale P. Bentz, James J. Filliben
This user's guide provides instructions for and examples of using the Concrete Optimization Software Tool (COST), a joint product of the Federal Highway Administration and the National Institute of Standards and Technology. COST provides an internet-based

Cooling of a Single Atom in an Optical Trap Inside a Resonator

July 1, 2001
Author(s)
S J. van Enk, J McKeever, H J. Kimble, Jun Ye
We present detailed discussions of cooling and trapping mechanisms for an atom in an optical trap inside an optical cavity, as relevant to recent experiments. The interference pattern of cavity QED and trapping fields in space makes the trapping wells
Displaying 45326 - 45350 of 73929
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