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Uniformity Studies of Congruent LiNbO3 by Means of Maker Fringe Analysis

Published

Author(s)

Norman Sanford, J A. Aust

Abstract

Nonlinear optical analysis was used to map the uniformity of LiNbO3 wafers in terms of birefringence, composition, thickness and strain. Birefringence variations are directly related to variations in the composition of the material. The typical variation in the Li2O content across a 76 mm diameter x-cut congruent LiNbO3 wafer was roughly 0.004 mol %. Examination of 25 wafers that were cut in sequence from a single boule revealed that the top of the boule was Li2O depleted with respect to the bottom by approximately 0.013 mol %. All wafers studied revealed thickness variations of 3-4 mm. Furthermore, strain of approximate magnitude 10-5 to 10-4 was revealed by intermixing of ordinary and extraordinary polarized second-harmonic generation. These findings reveal that nonlinear optical analysis could prove to be a valuable method to screen and select LiNbO3 wafers in the fabrication of integrated optical waveguide devices.
Citation
Properties of Lithium Niobate, K. K. Wong, Editor
Publisher Info
INSPEC, The Institution of Electrical Engineers, London, UK

Keywords

integrated optics, lithium niobate, manufacturing metrology, optical communication guidance & control

Citation

Sanford, N. and Aust, J. (2002), Uniformity Studies of Congruent LiNbO<sub>3</sub> by Means of Maker Fringe Analysis, INSPEC, The Institution of Electrical Engineers, London, UK (Accessed April 15, 2024)
Created December 31, 2001, Updated October 12, 2021