Uniformity Studies of Congruent LiNbO3 by Means of Maker Fringe Analysis

Published

January 1, 2002

Author(s)

Norman Sanford, J A. Aust

Abstract

Nonlinear optical analysis was used to map the uniformity of LiNbO₃ wafers in terms of birefringence, composition, thickness and strain. Birefringence variations are directly related to variations in the composition of the material. The typical variation in the Li₂O content across a 76 mm diameter x-cut congruent LiNbO₃ wafer was roughly 0.004 mol %. Examination of 25 wafers that were cut in sequence from a single boule revealed that the top of the boule was Li₂O depleted with respect to the bottom by approximately 0.013 mol %. All wafers studied revealed thickness variations of 3-4 mm. Furthermore, strain of approximate magnitude 10^-5 to 10^-4 was revealed by intermixing of ordinary and extraordinary polarized second-harmonic generation. These findings reveal that nonlinear optical analysis could prove to be a valuable method to screen and select LiNbO₃ wafers in the fabrication of integrated optical waveguide devices.

Citation

Properties of Lithium Niobate, K. K. Wong, Editor

Publisher Info

INSPEC, The Institution of Electrical Engineers, London, UK

Pub Type

Books

Keywords

integrated optics, lithium niobate, manufacturing metrology, optical communication guidance & control

Citation

Sanford, N. and Aust, J. (2002), Uniformity Studies of Congruent LiNbO₃ by Means of Maker Fringe Analysis, INSPEC, The Institution of Electrical Engineers, London, UK (Accessed March 21, 2025)