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Wavelength accuracy in WDM: techniques and standards for component characterization

Published

Author(s)

Sarah L. Gilbert, Shelley M. Etzel, William C. Swann

Abstract

Stable, accurately measured wavelength references can be used for wavelength calibration of instruments. We discuss both fundamental and artifact wavelength calibration references and give examples of how they can be used during optical component characterization.
Proceedings Title
Tech. Dig. Optical Fiber Communication Conf. (OFC)
Conference Dates
March 17-22, 2002
Conference Location
Anaheim, CA

Keywords

acetylene, carbon monoxide, hydrogen cyanide, spectroscopy, Standard Reference Material, wavelength calibration, wavelength division multiplexing, wavelength standards, WDM

Citation

Gilbert, S. , Etzel, S. and Swann, W. (2002), Wavelength accuracy in WDM: techniques and standards for component characterization, Tech. Dig. Optical Fiber Communication Conf. (OFC), Anaheim, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30130 (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2002, Updated February 19, 2017