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Displaying 44051 - 44075 of 143796

Three-dimensional Nanometrology with TSOM Optical Method

December 10, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry

Guidelines on Security and Privacy in Public Cloud Computing

December 9, 2011
Author(s)
Timothy Grance, Wayne Jansen
Cloud computing can and does mean different things to different people. The common characteristics most interpretations share are on-demand scalability of highly available and reliable pooled computing resources, secure access to metered services from

SRM NIST Standard Reference Materials Catalog, 2012

December 9, 2011
Author(s)
Regina R. Montgomery
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1200 individual reference materials produced and sold by NIST, each with carefully assigned values

Trapped-Ion State Detection through Coherent Motion

December 9, 2011
Author(s)
Till P. Rosenband, David Hume, Chin-Wen Chou, David R. Leibrandt, Michael J. Thorpe, David J. Wineland
Coherent control of trapped atomic ions has led to several recent advances in quantum information processing 1 and precision spectroscopy 2. A basic requirement for these and other quantum-metrology experiments is the ability to detect the state of an

An 84 Pixel All-Silicon Corrugated Feedhorn for CMB Measurements

December 8, 2011
Author(s)
John P. Nibarger, James A. Beall, Daniel T. Becker, Joseph W. Britton, Hsiao-Mei Cho, Anna E. Fox, Gene C. Hilton, Johannes Hubmayr, Dale Li, Kent D. Irwin, Jeffrey L. Van Lanen, Jeff McMahon, Ki Won Yoon
Silicon platelet corrugated feedhorn for cosmic microwave background (CMB) measurements in the mm wave (130 to 170 GHz) have been developed for deployment for the polarization sensitive upgrade to both the Atacama Cosmology Telescope (ACTpol) and the South

Electrochemical Micromachining of NiTi Shape Memory Alloys with Ultrashort Voltage Pulses

December 8, 2011
Author(s)
Joseph Maurer, John Hudson, Steven E. Fick, Thomas P. Moffat, Gordon A. Shaw
Electrochemical micromachining (ECMM) with ultrashort voltage pulses has been used to fabricate microstructures on a NiTi shape memory alloy (SMA). Because of its unique properties, NiTi is a desirable material for use in various applications including

Evolution of the Commensurate and Incommensurate Magnetic phases of the S{/I= {3/2} Kagome Staircase Co 3 V 2 O 8 in a Applied Field

December 8, 2011
Author(s)
Joel Helton, Georgii L. Bychkov, Sergei N. Barilo, Nyrissa Rogado, Robert J. Cava, Jeffrey W. Lynn
Single crystal neutron diffraction studies have been performed on the S = {3/2} kagome staircase compound Co 3V 2O 8 with a magnetic field applied along the magnetization easy-axis (H || a). Previous zero field measurements [Y. Chen, et al., Phys. Rev. B

Formation of y+10 and y+11 Ions in the Collision-Induced Dissociation of Peptide Ions

December 8, 2011
Author(s)
Lisa E. Kilpatrick, Pedatsur Neta, Xiaoyu Yang, Yamil Simon, Yuxue Liang, Stephen E. Stein
Tandem mass spectra of peptide ions, acquired in shotgun proteomic studies of selected proteins, tissues, and organisms, commonly include prominent peaks that cannot be assigned to the known fragmentation product ions (y, b, a, neutral losses). In many

Role Engineering: Methods and Standards

December 8, 2011
Author(s)
Edward Coyne, Timothy Weil, D. Richard Kuhn
This article explains problems and approaches to designing permission structures for role based access control. RBAC and the RBAC standard are summarized, common approaches to role engineering described, and the current status and plans for the INCITS role

Graphene: Plane and Simple Electrical Metrology?

December 7, 2011
Author(s)
Randolph E. Elmquist, Felipe Hernandez-Marquez, Mariano Real, Tian T. Shen, David B. Newell, Colin J. Jacob, George R. Jones
The development of large-area graphene has direct application to electrical standards including the quantized Hall resistance because of unique characteristics not found in conventional devices. These include symmetrical conduction by electrons and holes
Displaying 44051 - 44075 of 143796
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