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Displaying 43476 - 43500 of 74045

Measuring the Impact of Information on Complex Systems

June 1, 2002
Author(s)
Larry H. Reeker, Albert W. Jones
The application of power-driven machinery to manufacturing and other areas of human endeavor characterized the Industrial Revolution in the 18th and 19th centuries. Measurement contributed in many ways to the increasing economic influence of these machines

Microfluidic Temperature Gradient Focusing

June 1, 2002
Author(s)
David J. Ross, Laurie E. Locascio
A new technique is described for the concentration and separation of ionic species in a microchannels. Concentration is achieved by balancing the electrophoretic velocity of an analyte against the bulk flow of solution in the presence of a temperature

Modeling CPU Demand in Heterogeneous Active Networks

June 1, 2002
Author(s)
V Galtier, Kevin L. Mills, Y Carlinet
Active-network technology envisions deployment of virtual execution environments within network elements, such as switches and routers. As a result, application-specific processing can be applied to network traffic. To use such technology safely and

Multizone Modeling Approaches to Contaminant-Based Design

June 1, 2002
Author(s)
A L. Musser, Andrew K. Persily
Indoor air quality is currently addressed in the design process primarily through prescriptive building codes based on specified flow rates. However, a contaminant-based design approach opens the door to design innovation, offering opportunities for

Nonresonant Effects in One- and Two-Photon Transitions

June 1, 2002
Author(s)
U Jentschura, Peter J. Mohr
We investigate nonresonant contributions to Rayleigh scattering cross sections in atomic transitions. The problematic nonresonant contributions set a limit to the accuracy to which atomic spectra determine energy levels. Specifically, we show that off

On Differential Thermal Analyzer Curves for the Melting and Freezing of Alloys

June 1, 2002
Author(s)
William J. Boettinger, Ursula R. Kattner
A model for the response of differential thermal analysis measurement techniques to melting and freezing is explored. The model, which uses a system of ordinary differential equations, predicts sample, sample cup and thermocouple temperature histories

Phase-Coherent Synthesis of Optical Frequencies and Waveforms

June 1, 2002
Author(s)
Jun Ye, Steven T. Cundiff, S M. Foreman, T M. Fortier, John L. Hall, K W. Holman, D J. Jones, J D. Jost, H C. Kapteyn, K A. Leeuwen, L -. Ma, M M. Murnane, J L. Peng, R K. Shelton
Precision phase control of an ultrawide-bandwidth optical-frequency comb has produced remarkable and unexpected progress in both areas of optical-frequency metrology and ultrafast optics. A frequency comb (with 100 MHz spacing) spanning an entire optical

PMD Measurement Techniques - Avoiding Measurement Pitfalls

June 1, 2002
Author(s)
Paul A. Williams
Polarization-mode dispersion (PMD) is an interesting phenomenon. Unfortunately, interesting usually means complicated, and that is definitely the case with PMD. These complications can be troublesome when attempting to measure PMD. This presentation has

Polymer Composites with High Dielectric Constant

June 1, 2002
Author(s)
C. K. Chiang, R Popielarz
A very high dielectric constant polymer composite film system is presented. The new polymer composite film uses cyanoresin polymer filled with ferroelectric ceramics, such as BaTiO 3 powder. While the dielectric constant of the cyanoresin polymer at 1 kHz

Proceedings of the 12th Halon Options Technical Working Conference

June 1, 2002
Author(s)
Richard G. Gann
This proceedings contains the papers from the 12th Halon Options Technical Working Conference. The topics covered include: results from the DoD Next Generation Fire Suppression Technology Program, total flood applications, passive fire protection

Statistical Uncertainty Analysis of CCEM-K2 Comparisions of Resistance Standards

June 1, 2002
Author(s)
Nien F. Zhang, N Sedransk, Dean G. Jarrett
Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding

Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards

June 1, 2002
Author(s)
Nien F. Zhang, N Sedransk, Dean G. Jarrett
Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding
Displaying 43476 - 43500 of 74045
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