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Displaying 43476 - 43500 of 74303
A common concern about the use of particles a few nanometers in size in their stability. This paper addresses a technique for estimating the longevity on the basis of measurements that can be made in a reasonable time. Using the recently developed Preisach
A scanning capacitance microscope (SCM) combines a differential capacitance measurement with an atomic force microscope (AFM). The AFM controls the position and contact force of a scanning probe tip, and a sensor simultaneously measures the capacitance
Networked appliances and home networking are emerging technologies that promist to bring about a host of exciting opportunities for information technology in the home and small office environments. In the future, we will be able to control and exchange
This article reiterates the importance of homeland security in light of the events of September 11th and the necessity to integrate information technology security into enterprise security. Now, more than ever, the challenges of homeland security require a
Chapter 19 is concerned with shock and vibration standards covering: terminology; use and calibration of transducers and instrumentation; shock and vibration generators; structures and structural systems; vehicles including land-based, airborne, and ocean
Outdoor air intake rates of mechanical ventilation systems have traditionally been determined using prescriptive methods based on ventilation requirements per unit floor area or per occupant. This approach has serious shortcomings. It provides no
This directory is a listing of weights and measures officials in the U.S. and its territories. It includes the official's agency, title, address, phone, fax, e-mail, and some url addresses.
David A. Howe, Craig W. Nelson, F L. Walls, J F. Garcia nava, Archita Hati, A Sen Gupta
A 1OO GHz AM and PM noise measurement system is described. The basic approach to its construction is to apply existing state-of-the-art, cross-correlation noise measurement techniques to 1OO GHz (W-band).
Christopher L. Soles, Jack F. Douglas, Wen-Li Wu, H Peng, D W. Gidley
The manner in which the dynamics of a polymer are affected by thin film confinement is of technological significance, impacting thin film applications such as lubricants, adhesives, and chemically amplified photoresists. In this manuscript we use specular
The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stiffness
On the basis of a phase-field model previously proposed in Cahn et al. (acta Mater. 45, 4397-4413 (1997)) to describe the phenomenon of diffusion-induced grain boundary motion (DIGM), we present a formal asymptotic reduction to a moving free boundary
J N. Abdurashitov, V N. Gavrin, A V. Kalikhov, V L. Matushko, A A. Shikhin, V E. Yants, O S. Zaborskaia, J M. Adams, Jeffrey S. Nico, Alan Keith Thompson
Carl J. Williams, X Tang, M Hiekkero, J Rouzaud, R Lu, A Goedecke, Alan L. Migdall, A Mink, A Nakassis, Leticia S. Pibida, J Wen, Edward W. Hagley, Charles W. Clark