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Displaying 42426 - 42450 of 74348

Interlaboratory comparison of InGaAsP EX-SITU characterization

January 1, 2003
Author(s)
Alexana Roshko, Kristine A. Bertness
A study to improve the accuracy of ex-situ characterization of InGaAsP materials for optoelectronics is underway. Six InGaAsP thin film specimens, with nominal photoluminescence wavelengths of 1.1, 1.3 and 1.5 mm, have been measured, with X-ray diffraction

Investigation of the Shape of InGaAs/GaAs Quantum Dots

January 1, 2003
Author(s)
Susan Y. Lehman, Alexana Roshko, Richard Mirin, John E. Bonevich
Three samples of self-assembled In 0.44Ga 0.56As quantum dots (QDs) grown on (001) GaAs by molecular beam epitaxy (MBE) were studied using atomic force microscopy (AFM)) and high-resolution transmission electron microscopy (TEM) in order to characterize

Long-Term Water-Aging of Whisker-Reinforced Polymer-Matrix Composites

January 1, 2003
Author(s)
Hockin D. Xu
Long-term exposure to water may degrade dental resin composites. This study investigated the water-aging effects on whisker-reinforced composites. It was hypothesized that silica-fused whiskers would provide stable and substantial reinforcement, and
Displaying 42426 - 42450 of 74348
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