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Displaying 42201 - 42225 of 73697

Ultrawideband Time- and Frequency-Domain Characterization of EMC Facilities

January 1, 2003
Author(s)
David R. Novotny, Robert T. Johnk, Claude Weil, Seturnino Canales
We have developed a methodology to determine the quality of an EMC test facility using equipment generally available to RF testing services. By utilizing both the time- and frequency-domain, an accurate picture of the scattering and modal properties of the

UML Model for the IEEE 1451.1 Standard

January 1, 2003
Author(s)
Kang B. Lee, Yuyin Song
The IEEE 1451.1 Standard for Smart Transducer Interface for Sensors and Actuators- Network Capable Application Processor (NCAP) Information Model was established to define a common objective model and interface specification for the components of a

Uncertainty Budgets for Realization of ITS-90 by Radiation Thermometry

January 1, 2003
Author(s)
J Fischer, M Battuello, M Sadli, M Ballico, S N. Park, P Saunders, Y Zundong, B. Carol Johnson, E Van der Ham, F Sakuma, Graham Machin, N Fox, W Li, S Ugur, M Matveyev
Recent international comparisons [1,2] and key comparisons have shown that the realization of the ITS-90 above the freezing point of silver and its dissemination may be less straightforward than expected. In many cases, the deviations of the local scale

Updated NIST Photomask Linewidth Standard

January 1, 2003
Author(s)
James E. Potzick, J Pedulla, Michael T. Stocker
NIST is preparing to issue the next generation in its line of binary photomask linewidth standards. Called SRM 2059, it was developed for calibrating microscopes used to measure linewidths on photomasks, and consists of antireflecting chrome line and space
Displaying 42201 - 42225 of 73697
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