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Displaying 42101 - 42125 of 73697

Surface Finish and Sub-Surface Metrology

January 1, 2003
Author(s)
Theodore V. Vorburger, Ndubuisi George Orji, Li Piin Sung, T Rodriguez
Surface finsih affects the performance of a wide variety of manufactured products ranging from road surfaces and ships to mechanical parts, microelectronics, and optics. Accordingly roughness values can vary over many orders of magnitude. A variety of

Surface finish effects on partial discharge with embedded electrodes

January 1, 2003
Author(s)
Aleta T. Wilder, Robert E. Hebner, Yicheng Wang
Partial discharge measurements have been used to characterize the response of dielectric insulation materials exposed to ac voltages. Electrode surface finish can affect such partial discharge characteristics. This paper provides comparisons to the effect

Surface Metrology Software Variability in Two-Dimensional Measurements

January 1, 2003
Author(s)
Ndubuisi G. Orji, Theodore V. Vorburger, Xiaohong Gu, Jayaraman Raja
A range of surface texture measurement instruments is available in the market place. Most of the measurement instruments are microcomputer-based systems that contain their own surface analysis software to evaluate measured roughness profiles. After a

Sympathetic cooling of 9 Be + and 24 Mg + for quantum logic

January 1, 2003
Author(s)
Murray D. Barrett, B. L. DeMarco, T Schaetz, Dietrich Leibfried, Joseph W. Britton, J Chiaverini, Wayne M. Itano, Branislav M. Jelenkovic, John D. Jost, Christopher Langer, Till P. Rosenband, David J. Wineland
We demonstrate the cooling of a two species ion crystal consisting of one 9Be+ and one 24Mg+ ion. Since the respective cooling transitions of these two species are separated by more than 30 nm, laser manipulation of one ion has negligible effect on the

System-Level Calibration of a Transfer Radiometer Used to Validate EOS Radiance Scales

January 1, 2003
Author(s)
Bettye C. Johnson, Steven W. Brown, George P. Eppeldauer, Keith R. Lykke
A number of transfer radiometers have been developed by the National Institute of Standards and Technology (NIST) with the support and funding of the National Aeronautics and Space Administration's (NASA's) satellite sensor calibration programs. The
Displaying 42101 - 42125 of 73697
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