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Displaying 41726 - 41750 of 73969

A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM

January 1, 2003
Author(s)
Xuezeng Zhao, Theodore V. Vorburger, Joseph Fu, Jun-Feng Song, C Nguyen
Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro-mechanical engineering. With the development of manufacturing technology in recent years, the

A Phenomenological Droplet Impact Model for Lagrangian Spray Transport

January 1, 2003
Author(s)
P E. DesJardin, Cary Presser, P J. Disimile, J R. Tucker
The overall objective of this research is to gain fundamental knowledge of fire-suppression agent transport in the cluttered environments of aircraft engine nacelles (i.e., hydraulic and electrical lines, mounting brackets, etc.). A new generation of Halon

A ratiometric method for Johnson noise thermometry using a quantized voltage noise source

January 1, 2003
Author(s)
Sae Woo Nam, Samuel Benz, John M. Martinis, Paul Dresselhaus, Weston L. Tew, David R. White
Johnson Noise Thermometry (JNT) involves the measurement of the statistical variance of a fluctuating voltage across a resistor in thermal equilibrium. Modern digital techniques make it now possible to perform many functions required for JNT in highly

A Two-Phase Airframe Shielding Performance Study Using Ultra-wideband Measurement Systems

January 1, 2003
Author(s)
Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Seturnino Canales, Claude Weil, Jason Veneman
The National Institute of Standards and Technology participated in a comprehensive study of electromagnetic aircraft shielding. The effort consisted of two parts: (1) shielding measurements on a box model with a simple and precisely controlled geometry

Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations

January 1, 2003
Author(s)
Todd E. Harvey, Kristine A. Bertness, Robert K. Hickernell, C. M. Wang, Jolene Splett
We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth rates
Displaying 41726 - 41750 of 73969
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