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Displaying 39426 - 39450 of 73697

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004
Author(s)
Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter
We report on a comparative measurement of SiO 2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were

Comparison of Macro-Tip/Tilt and Mesoscale Position Beam-Steering Transducers for Free-Space Optical Communications Using a Quadrant Photodiode Sensor

January 1, 2004
Author(s)
K B. Fielhauer, B G. Boone, J R. Bruzzi, Jeffery Kluga, J R. Connelly, M M. Bierbaum, Jason J. Gorman, Nicholas Dagalakis
The National Aeronautics and Space Administration (NASA) plans to develop optical communication terminals for future spacecraft, especially in support of high data rate science missions and manned exploration of Mars. Future, very long-range missions, such

Condensation Flame of Acetylene Decomposition

January 1, 2004
Author(s)
Valeri I. Babushok, A W. Miziolek
Acetylene decomposition flame propagation was studied as the result of the condensation reaction. The used kinetic models reasonably predict the level of burning velocity of acetylene decomposition flame. Nevertheless the models do not demonstrate pressure

Convergent-Beam Neutron Crystallography

January 1, 2004
Author(s)
W M. Gibson, A J. Schultz, J W. Richardson, J M. Carpenter, D F. Mildner, Heather H. Chen-Mayer, M E. Miller, E R. Maxey, R Youngman
Displaying 39426 - 39450 of 73697
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