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NIST Authors in Bold

Displaying 38576 - 38600 of 74141

An XML Schema Naming Assister for Elements and Types

October 1, 2004
Author(s)
Puja Goyal
Providing a consistent naming convention for elements and types is essential in the creation, development, and maintenance of Extensible Markup Language (XML) schemas. It improves schema readability and consistency, consequently speeding up future schema

Application of the Josephson Effect to Metrology

October 1, 2004
Author(s)
Samuel P. Benz, Clark Hamilton
The unique ability of a Josephson junction to control the flow of magnetic flux quanta leads to a perfect relationship between frequency and voltage. Over the last 30 years, metrology laboratories have used this effect to greatly improve the accuracy of dc

Building Stones of America: 50 Years of the NIST Stone Test Wall

October 1, 2004
Author(s)
Paul E. Stutzman, J Raz
In 1880 the Census Office and the National Museum in Washington, DC conducted a study of building stones of the United States and collected a set of reference specimens from working quarries. This collection was merged with the Centennial Collection of US

Building Stones of America: Over 50 Years of the NIST Stone Test Wall.

October 1, 2004
Author(s)
Paul E. Stutzman
In 1880, the Census Office and the National Museum in Washington, D.C., conducted a study of building stones of the United States and collected a set of reference specimens from working quarries. The census that year reported descriptions of producing

Combinatorial Methods for Rapid Screening of Biomaterials

October 1, 2004
Author(s)
Carl G. Simon Jr., N Washburn, S B. Kennedy, Naomi Eidelman, Y N. Deng, Eric J. Amis
Current methods for biomaterials development involve one-specimen-at-a-time characterization which is costly and time-consuming. Combinatorial and high-throughput methods hold the potential to enhance research and development in any field of scientific

Compact Models for Silicon Carbide Power Devices

October 1, 2004
Author(s)
Ty R. McNutt, Allen R. Hefner Jr., Alan Mantooth, David W. Berning, Ranbir Singh
The development of compact silicon carbide (SiC) power semiconductor device models for circuit simulation is described. The work detailed herein has been used to model power Schottky, Merged-PiN-Schottky, PiN diode, and MOSFET models. In these models, the

Comparison of Strength Properties of Normotensive and Hypertensive Rat Pulmonary Arteries

October 1, 2004
Author(s)
Elizabeth S. Drexler, Christopher N. McCowan, J Wright, Andrew J. Slifka, Dunbar Ivy, Robin Shandas
A series of tests were conducted to quantify the difference in the mechanical properties of normo-and hypertensive pulmonary arteries. A bubble-test design was emplpoyed to measure the biaxial properties of a segment of artery. The test results compare the

Constitutive Models for a Poly(e-caprolactone) Scaffold

October 1, 2004
Author(s)
Timothy P. Quinn, Tammy L. Oreskovic, Christopher N. McCowan, N Washburn
We investigate material models for a porous, polymeric scaffold used for bone. The material was made by co-extruding poly (e-caprolactone) (PCL), a biodegradable polyester, and poly(ethylene oxide)(PEO). The water soluble PEO was removed resulting in a

Critical Review of the Current Status of Thickness Measurements for Ultrathin SiO2 on Si, Part V: Results of a CCQM Pilot Study

October 1, 2004
Author(s)
M P. Seah, S J. Spencer, F Bensebaa, I Vickridge, H Danzebrink, Michael Krumrey, T Gross, W Oesterle, E Wendler, B Rheinlander, Yasushi Azuma, I Kojima, N Suzuki, M Suzuki, Shigeo Tanuma, D W. Moon, Hansuek Lee, H Cho, H Y. Chen, A T. Wee, T Osipowicz, J S. Pan, W A. Jordaan, R Hauert, U Klotz, C van der marel, M Verheijen, Y Tamminga, C Jeynes, P Bailey, S Biswas, U Falke, Nhan Van Nguyen, Deane Chandler-Horowitz, James R. Ehrstein, D Muller, Joseph Dura

Cross-Enterprise Documents Sharing (XDS)

October 1, 2004
Author(s)
William J. Majurski
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Elastic, Anelastic, Piezoelectric Coefficients of Monocrystal Lithium Niobate

October 1, 2004
Author(s)
H M. Ledbetter, H Ogi, N Nakamura
Using improved acoustic spectroscopy, we determined the complete above coefficients (16 independent ones) by measuring the macroscopic resonance frequencies of a single lithium-niobate monocrystal. The improvement consisted of using laser-Doppler

Electrical material property measurements using a free-field, ultra-wideband system

October 1, 2004
Author(s)
Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Seturnino Canales, James R. Baker-Jarvis, Michael D. Janezic, Jim L. Drewniak, Marina Kolednitseva, Jianmin Zhang, Poornachander Rawa
Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material

Evaluation of Elastic Modulus and Hardness of Thin Films By Nanoindentation

October 1, 2004
Author(s)
Yeon-Gil G. Jung, Brian R. Lawn, M Martyniuk, H Huang, X Z. Hu
Simple equations are proposed for determining elastic modulus and hardness properties of thin films on substrates from nanoindentation experiments. The empirical formulation relates the modulus E and hardness H of the film/substrate bilayer to
Displaying 38576 - 38600 of 74141
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