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Displaying 38601 - 38625 of 143806

Frameworks and Data Initiatives for Smart Grid and other Cyber-Physical Systems

July 1, 2013

Author(s)

David A. Wollman

I describe the NIST smart grid framework and its applicability as a model for organizational efforts to advance cyber-physical systems, and provide an overview of smart grid data initiatives.

Guide to Enterprise Patch Management Technologies:

July 1, 2013

Author(s)

Murugiah Souppaya, Karen Scarfone

Guide to Malware Incident Prevention and Handling for Desktops and Laptops:

July 1, 2013

Author(s)

Murugiah Souppaya, Karen Scarfone

Identification of an Alternate Substrate for Testing Reduced Ignition Propensity Cigarettes

July 1, 2013

Author(s)

Amanda P. Robbins, Richard Gann, William F. Guthrie

Results from ASTM E2187, ISO 12863 and NZS/AS4830 for testing the ignition propensity of cigarettes have limitations that include sensitivity to mass, moisture content, and surface roughness of the filter paper substrate, variations in test results when

IREX IV part 1 : evaluation of iris identii!cation algorithms:

July 1, 2013

Author(s)

George W. Quinn, Patrick Grother, Mei Ngan

IREX VI : Temporal Stability of Iris Recognition Accuracy:

July 1, 2013

Author(s)

P. Grother, J. R. Matey, E. Tabassi, G. W. Quinn, M. Chumakov

July 2013 SRM Spotlight

July 1, 2013

Author(s)

Regina R. Montgomery

The SRM Spotlight is a newsletter published by the Office of Reference Materials for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Method for measuring axis orthogonality in MEMS accelerometers:

July 1, 2013

Author(s)

Craig D. McGray, Yaqub Afridi, Jon Geist

Metrology for Additive Manufacturing - Opportunities in a Rapidly Emerging Technology

July 1, 2013

Author(s)

John A. Slotwinski, Thomas A. Campbell

Additive Manufacturing (AM) is a group of emerging technologies that create objects from the bottom-up by adding material one cross-sectional layer at a time. The AM process begins with a three-dimensional model of the object, usually created by computer