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Displaying 37776 - 37800 of 74165

Infrared and Raman Spectroscopy Characterization of Biological Products

January 1, 2005
Author(s)
Vytautas Reipa
Both infrared and Raman are increasingly applied in biomolecular structure characterization, thus getting acceptance alongside traditional bioanalytical techniques. Physical principles and biological sampling requirements are reviewed. Advanced

Integrating IT Security into the Capital Planning and Investment Control Process

January 1, 2005
Author(s)
Joan Hash, N Bartol, H Rollins, W Robinson, J Abeles, S Batdorff
Traditionally, information technology (IT) security and capital planning and investment control (CPIC) processes have been performed independently by security and capital planning practitioners. However, the Federal Information Security Management Act

Internet-Based Surface Metrology Algorithm Testing System

January 1, 2005
Author(s)
Mark C. Malburg, Jayaraman Raja, Son H. Bui, Thomas Brian Renegar, Bui Son Brian, Theodore V. Vorburger
Software is an integral part of most measurement systems and it is particularly important in roughness measurement and analysis. Evaluation and assessment of measured roughness profiles must be performed in accordance with standards. Different types of

IPC-Split Cylinder Standard

January 1, 2005
Author(s)
James R. Baker-Jarvis
This method is intended for the nondestructive measurement of the relative permittivity and loss tangent of unclad dielectric substrates at microwave frequencies using a split-cylinder resonator

Issues in Line Edge and Linewidth Roughness Metrology

January 1, 2005
Author(s)
John S. Villarrubia
In semiconductor electronics applications, line edge and linewidth roughness are generally measured using a root mean square (RMS) metric. The true value of RMS roughness depends upon the length of edge or line that is measured and the chosen sampling
Displaying 37776 - 37800 of 74165
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